Circuit for testing circuit blocks controlled by microinstructions

摘要

The test circuit of this invention is used for testing the circuit blocks of an integrated circuit device controlled by microinstructions. The test circuit includes a microinstruction register. This test circuit holds both a microinstruction read out of a micro-ROM and a control signal set externally to test the circuit blocks of the integrated circuit device. The control signal set in the microinstruction register is decoded by a microdecoder to test the operations of the circuit blocks.