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Fault simulator comprising a signal generating circuit implemented by hardware

机译:故障模拟器,包括由硬件实现的信号产生电路

摘要

In a fault simulator for simulating a logic circuit model which is operable in response to first through n-th input pattern signals, a signal generating circuit implemented by hardware generates the first through the n-th input pattern signals. The logic circuit model is assorted into first through m-th levels and is defined by first through p- th faults. The fault simulator carries out a plurality of simulations at the same time in each of the first through the m-th levels. When the simulation proceeds to the m-th level, the fault simulator produces a simulation result signal representative of detected faults and a correct value. The fault simulator simulates the first through the p-th faults by the use of each of the first through the n-th input pattern signals.
机译:在用于模拟可响应于第一至第n输入模式信号而操作的逻辑电路模型的故障模拟器中,由硬件实现的信号生成电路生成第一至第n输入模式信号。逻辑电路模型分为第一级至第m级,并由第一级至第p级故障定义。故障模拟器在第一级到第m级中的每个级别同时执行多个仿真。当仿真进行到第m级时,故障仿真器会生成表示检测到的故障和正确值的仿真结果信号。故障模拟器通过使用第一至第n输入模式信号中的每一个来模拟第一至第p故障。

著录项

  • 公开/公告号US5410678A

    专利类型

  • 公开/公告日1995-04-25

    原文格式PDF

  • 申请/专利权人 NEC CORPORATION;

    申请/专利号US19920819332

  • 发明设计人 SHIGERU TAKASAKI;

    申请日1992-01-10

  • 分类号G06F15/20;

  • 国家 US

  • 入库时间 2022-08-22 04:05:04

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