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Optical probe for remote attenuated total reflectance measurements

机译:光学探头,用于远程衰减全反射率测量

摘要

A probe for use in attentuated total reflectance measurements in spectroscopy, such as Fourier transform infrared spectroscopy, is formed of an optical waveguide element having input and output sections and a loop between the two sections. The loop has a small radius of curvature and is exposed so that it can be contacted with a sample to obtain attenuated total reflectance measurements. The input and output sections may be retained in the bore of a thin walled tube with the loop forming a tip which extends from one end of the tube. The input and output sections of the optical waveguide element may be connected by couplers to a spectrometer to receive the output beam from and provide a return beam to the spectrometer. The tightly curved surfaces of the optical waveguide element at the loop result in multiple internal reflections as the beam of radiation traverses the loop. Attenuated total reflectance interactions occur between the beam of radiation and sample material in contact with the loop, which can comprise a liquid, a gas, or relatively soft solid materials.
机译:在诸如傅里叶变换红外光谱的光谱学中用于衰减全反射率测量的探针由具有输入和输出部分以及在这两个部分之间的环路的光波导元件形成。环路的曲率半径较小,并且暴露在外,因此可以与样品接触以获得衰减的全反射率测量值。输入和输出部分可以被保持在薄壁管的孔中,其中环形成从管的一端延伸的尖端。光波导元件的输入和输出部分可以通过耦合器连接到光谱仪,以接收来自光谱仪的输出光束并向光谱仪提供返回光束。当辐射束穿过环路时,光波导元件在环路处的紧密弯曲的表面会导致多次内部反射。衰减的全反射相互作用在辐射束和与环路接触的样品材料之间发生,相互作用可以包括液体,气体或相对较软的固体材料。

著录项

  • 公开/公告号US5436454A

    专利类型

  • 公开/公告日1995-07-25

    原文格式PDF

  • 申请/专利权人 NICOLET INSTRUMENT CORPORATION;

    申请/专利号US19930138631

  • 发明设计人 STEPHEN R. LOWRY;AHARON BORNSTEIN;

    申请日1993-10-15

  • 分类号G01N21/01;G01N21/31;G01N21/35;

  • 国家 US

  • 入库时间 2022-08-22 04:04:35

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