首页>
外国专利>
Non-contacting capacitance probe for dielectric cure monitoring
Non-contacting capacitance probe for dielectric cure monitoring
展开▼
机译:非接触式电容探头,用于介电固化监控
展开▼
页面导航
摘要
著录项
相似文献
摘要
Conductive measuring electrodes, of a capacitive probe having a grounded rd electrode positioned therebetween shield a probe circuit, provides mutual capacitance measurements which way as a function of changes in impedance of dielectric material being monitored as it undergoes a curing process. The probe is positioned in non-embedded relation to the dielectric material to form a sensitivity region therein through which an electric field extends between the conductive measuring electrodes of the probe to establish said variable mutual capacitance measurements without extraneous influences.
展开▼