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Reference substrate de in automatic test equipment - other modes of teaching

机译:自动测试设备中的参考基材DE-其他教学模式

摘要

PURPOSE:To reduce the labor needed for registration and also to improve the inspection accuracy by supplying the parts information needed for inspecting of a circuit board to be inspected based on the difference between the picture of an element circuit board and that of a reference circuit board. CONSTITUTION:The parts 19-1-19-n are set on an element circuit board 18 put on a reference printed circuit board 16-1 at each correct position and in each correct posture. A processing part 12 processes the picture signals of a printed circuit board 16-2 to be inspected supplied from an image pickup part 11 and extracts the inspection parameters of those parts 19-1-19-n respectively according to the extraction reference, the processing procedure, etc., of parameters. These inspection parameters are compared with a reference parameter for decision of the quality of the printed circuit board 16-2 to be inspected. Then the decided quality of the printed circuit board 16-2 is displayed at a decided result output part 26.
机译:目的:通过提供基于元件电路板图片与参考电路板图片之间的差异,提供检查电路板检查所需的零件信息,从而减少注册所需的劳力并提高检查精度。组成:零件19-1-19-n以每个正确的位置和正确的姿势放置在放置在参考印刷电路板16-1上的元件电路板18上。处理部分12处理从图像拾取部分11提供的要检查的印刷电路板16-2的图像信号,并根据提取基准分别提取那些部分19-1-19-n的检查参数,处理参数的程序等。将这些检查参数与参考参数进行比较,以决定要检查的印刷电路板16-2的质量。然后,在判定结果输出部26处显示印刷电路板16-2的判定质量。

著录项

  • 公开/公告号JPH07107650B2

    专利类型

  • 公开/公告日1995-11-15

    原文格式PDF

  • 申请/专利权人 オムロン株式会社;

    申请/专利号JP19860023295

  • 发明设计人 四ツ谷 輝久;

    申请日1986-02-05

  • 分类号G05B19/42;G01N21/88;H05K13/08;

  • 国家 JP

  • 入库时间 2022-08-22 03:59:31

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