首页> 外国专利> DATA BASE INQUIRY SYSTEM USING VENN DIAGRAM

DATA BASE INQUIRY SYSTEM USING VENN DIAGRAM

机译:使用维恩图的数据库查询系统

摘要

PURPOSE: To attain the inquiry of a data base in various conditional expressions where the truth/falsehood value of conditions are combined together just by pointing a Venn diagram area that is secured on an inquiry window. ;CONSTITUTION: An inquiry window 1 has a Venn diagram that displays a closed curve showing a partial set where the condition designated by an input device 2 is satisfied for inquiry of all records included in an inquiry object as a total set. An inquiry window control means 4 draws a closed curve in the Venn diagram or deletes it and synthesizes an inquiry conditional expression from the designated conditions to give an inquiry execution request to a data base server 5 in response to the event generated at the window 1 and based on a Venn diagram display information storage area 3. An inquiry result output means 7 displays the records on an output device 8 or prints them which are retrieved out of a data base by the server 5 and stored in an inquiry result storage area 6.;COPYRIGHT: (C)1996,JPO
机译:目的:通过各种条件表达式来实现对数据库的查询,在这些条件表达式中,仅通过指向固定在查询窗口上的维恩图区域即可将条件的真假值组合在一起。 ;组成:查询窗口1具有维恩图,该图显示闭合曲线,该曲线表示满足输入设备2所指定的条件以查询包括在查询对象中的所有记录作为总集的部分集。查询窗口控制装置4在维恩图中绘制一条闭合曲线或将其删除,并根据指定条件合成查询条件表达式,以响应在窗口1和2处产生的事件向数据库服务器5发出查询执行请求。查询结果输出装置7基于维恩图显示信息存储区域3。查询结果输出装置7将记录显示在输出设备8上或将其打印,这些记录由服务器5从数据库中检索出并存储在查询结果存储区域6中。 ;版权:(C)1996,日本特许厅

著录项

  • 公开/公告号JPH0816607A

    专利类型

  • 公开/公告日1996-01-19

    原文格式PDF

  • 申请/专利权人 NEC CORP;

    申请/专利号JP19940174705

  • 发明设计人 AZUMA TOMIHIKO;

    申请日1994-07-04

  • 分类号G06F17/30;

  • 国家 JP

  • 入库时间 2022-08-22 03:58:34

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号