METHOD FOR MEASURING CREEP LIFE CONSUMPTION RATE OF MATERIAL OF HIGH-TEMPERATURE DEVICE

摘要

PURPOSE: To realize a method by which the creep life consumption rate can be accurately measured in a short, time with a small amount of specimens collected from a material of a using high-temperature device. ;CONSTITUTION: A part of a using high-temperature device is collected to produce a specimen 1. Tensile stresses of various sizes are instantaneously impressed to the specimen 1. The amount of strain of the specimen 1 immediately after the impression of the tensile stress is measured thereby to obtain the internal stress. Then, the creep life consumption rate is obtained from the relationship of the creep life consumption rate obtained beforehand for the material and the internal stress. In this manner, results can be obtained in a shorter time than in a conventional destructive test, so that an actual device can be quickly feedback. At the same time, costs can be reduced and the internal stress can be measured by the single specimen 1. It is accordingly enough to collect a small amount of the material from a subject part of the high-temperature device and the repairing or welding work, etc., after the collection of the material can be simple.;COPYRIGHT: (C)1996,JPO