首页> 外国专利> MEASURING SYSTEM FOR DETERIORATION OF ELECTROPHOTOGRAPHIC SENSITIVE BODY AND ELECTROPHOTOGRAPHIC APPARATUS USING THE SYSTEM

MEASURING SYSTEM FOR DETERIORATION OF ELECTROPHOTOGRAPHIC SENSITIVE BODY AND ELECTROPHOTOGRAPHIC APPARATUS USING THE SYSTEM

机译:利用该系统测定光电敏感体和光电仪器的测量系统

摘要

PURPOSE: To non-destructively determine a service life of resolution (deterioration) of an electrophotographic sensitive body by measuring reflection absorbance from the sensitive body and comparing it with known absorbance. ;CONSTITUTION: Light from a light source 5 is transmitted via switching parts 3, 4 and a reference optic fiber 6 to a light amount measuring part 7. The measuring part 7 incorporates a spectrometer comprising an interference filter for measuring a reference light amount IR for each wavelength (350 to 700nm) and outputting it to a deterioration calculating part 1 for storage. Then light from the light source 5 is cast via the switching part 3 and a casting fiber 8 to a surface 10 of an electrophotographic sensitive body in a reflected light measuring part 9, the reflected light 11 is led to a measuring part 7 by a light receiving fiber 12 to measure a reflected light amount I'R, and reflection absorbance (IR-I'R)/IR×100 is calculated in the calculating part 1. This is compared with stored initial or normal reflection absorbance of the sensitive body 10, and a change corresponding to an ultraviolet visible absorption spectrum of a charge transfer material before and after electrolysis is recognized, thereby determining deterioration of the sensitive body 10.;COPYRIGHT: (C)1996,JPO
机译:目的:通过测量感光体的反射吸光度并将其与已知吸光度进行比较,以非破坏性的方式确定电子照相感光体的分辨率(劣化)的使用寿命。 ;组成:来自光源5的光通过开关部件3、4和参考光纤6传输到光量测量部件7。测量部件7装有光谱仪,该光谱仪包括用于测量用于测量参考光量IR的干涉滤光片。各波长(350〜700nm)输出到劣化计算部1进行存储。然后,来自光源5的光经由切换部3和流延纤维8被投射到反射光测量部9中的电子照相感光体的表面10,反射光11被光引导至测量部7。接收光纤12以测量反射光量I'R,并且在计算部1中计算反射吸收率(IR-I'R)/ IR×100。将其与存储的敏感体10的初始或正常反射吸收率进行比较。 ,并识别出与电解前后的电荷转移材料的紫外可见吸收光谱相对应的变化,从而确定感光体10的劣化。;版权:(C)1996,JPO

著录项

  • 公开/公告号JPH085549A

    专利类型

  • 公开/公告日1996-01-12

    原文格式PDF

  • 申请/专利权人 HITACHI LTD;

    申请/专利号JP19940139842

  • 申请日1994-06-22

  • 分类号G01N21/27;G03G15/00;G03G21/00;

  • 国家 JP

  • 入库时间 2022-08-22 03:55:17

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号