首页> 外国专利> Hydrogenated amorphous silicon linear position-sensitive detector (LTFPSD).

Hydrogenated amorphous silicon linear position-sensitive detector (LTFPSD).

机译:氢化非晶硅线性位置敏感检测器(LTFPSD)。

摘要

This invention relates to an optoelectronic device, called a linear position-sensitive detector (LTFPSD), to be used in 3-D inspection systems (including two- dimensional systems), such as surfaces, defects, determining profiles, etc. This device consists of n (in which n can vary, for example, from 16 to 4096) one-dimensional position detectors integrated and arranged in parallel or in the form of a matrix, with two or four electrical contacts at the ends, for extracting the analog signal, which is then processed via external read circuits. Each element of the device supplies information continuously, on the position of a point of the line of light projected onto the surface (or medium to be inspected), with a direct linear relationship existing between the position of the line of light (or beam) and the signals (voltage or current) collected by each sensor element. Using this invention it is possible to carry out a survey of any surface (e.g. by using laser triangulation or interferometry) quickly and directly, without limitations on the digitized information and in a more compact form. The dimensioning of the device is a function of the application and may vary from 100m x 100m to 20cm x 20cm. IMAGE
机译:本发明涉及一种被称为线性位置敏感检测器(LTFPSD)的光电设备,该光电设备用于3-D检查系统(包括二维系统)中,例如表面,缺陷,确定轮廓等。 n个(其中n可以从16到4096变化)的一维位置检测器,以矩阵形式并行或并行集成和布置,在末端具有两个或四个电触点,用于提取模拟信号,然后通过外部读取电路进行处理。设备的每个元件在投射到表面(或要检查的介质)上的光线的点的位置上连续提供信息,光线(或光束)的位置之间存在直接的线性关系。以及每个传感器元件收集的信号(电压或电流)。使用本发明,可以快速而直接地对任何表面进行测量(例如通过使用激光三角测量或干涉测量法),而不受数字化信息的限制,并且形式更紧凑。设备的尺寸取决于应用程序,并且可能从100m x 100m到20cm x 20cm不等。 <图像>

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