ROSETTE-TYPE OPTICAL MICROSYSTEM OF STRAIN GAUGES HAVING DIELECTRIC GUIDES FOR MEASURING A LONGITUDINAL STRAIN IN A PLANAR STRUCTURE

摘要

The present invention relates to a planar, rosette-type, optical microsystem with strain gauges having dielectric guides used for measuring a system of strains or stresses applied to a part, in which the part is under purely longitudinal strain, at least one rosette being formed by at least two strain gauges with dielectric guides (J1, J2, J3) and in which a calculating circuit makes it possible to determine said strain by resolving a system of equations.