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CHEMICALLY DIFFERENTIATED IMAGING BY SCANNING ATOMIC FORCE MICROSCOPY
CHEMICALLY DIFFERENTIATED IMAGING BY SCANNING ATOMIC FORCE MICROSCOPY
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机译:通过扫描原子力显微镜化学分辨成像
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摘要
The invention relates to a process for chemically differentiated imaging by means of scanning atomic force microscopy using chemically modified probes, where the imaging is carried out in normal force mode, elasticity mode, tapping mode or non-contact mode. The novel process is suitable for imaging industrial surfaces.
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