首页> 外国专利> METHOD AND APPARATUS FOR REDUCING ARCING IN PLASMAMETHOD AND APPARATUS FOR REDUCING ARCING IN PLASMA PROCESSING CHAMBERS PROCESSING CHAMBERS

METHOD AND APPARATUS FOR REDUCING ARCING IN PLASMAMETHOD AND APPARATUS FOR REDUCING ARCING IN PLASMA PROCESSING CHAMBERS PROCESSING CHAMBERS

机译:减少等离子体中弧度的方法和装置以及减少等离子体中弧度的装置加工室

摘要

Arcing in a plasma process is reduced by shaping the target (40) and dark space shield (13) so that their peripheral regions curve away from each other, reducing electric fields and the propensity for arcing between the target and dark space shield. Also disclosed is an improved system for detecting arcing and presenting data related to detected arcs for analysis; the system generates a graph of the number of arcs, or rate of arcing, as a function of total power consumed, or alternatively a histogram of bars (120) each indicating the number of arcs having an associated magnitude.
机译:通过使靶材(40)和暗室屏蔽(13)成形,从而使它们的周边区域相互弯曲,减少了等离子体工艺中的电弧,从而减小了电场,并减小了靶材和暗室屏蔽之间的电弧倾向。还公开了一种改进的系统,用于检测电弧并呈现与检测到的电弧有关的数据以进行分析;该系统生成作为消耗的总功率的函数的电弧数量或电弧率的图表,或者可替代地,条形柱状图(120)的直方图,每个柱形图指示具有相关大小的电弧数量。

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