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Foreign body inspection device and foreign body inspection method

机译:异物检查装置及异物检查方法

摘要

For example, the presence of foreign matter on the surface of the object to be detected such as a reticle with high accuracy and reliably.;The foreign object inspection apparatus comprises: (1) a laser light source 1 for calculating a laser light having an interference distance of 1 km or more, (2) scanning the surface of the inspected object 71 with this laser light, (C) a light detecting device 60 for detecting the light reflected and diffracted at the surface of the inspected object 71, (d) an inspected object 71 placed in a predetermined direction , And (E) a gas supply means (80) for bringing the atmosphere in which the inspected object (71) is arranged into a high purity inert gas atmosphere. In the foreign substance inspection method, the atmosphere in which the inspected object is disposed is set to a high purity inert gas atmosphere, and while moving the inspected object in a predetermined direction, the surface of the inspected object with the laser light having the wavelength And detects light reflected and diffracted on the surface thereof to detect foreign matter present on the surface of the object to be inspected.
机译:例如,在诸如标线片之类的待检测物体的表面上以高精度且可靠地存在异物。异物检查设备包括:(1)用于计算具有以下特征的激光的激光源1: 1 km或更大的干涉距离;(2)用这种激光扫描被检物71的表面;(C)用于检测在被检物71的表面反射和衍射的光的光检测装置60;(d )沿预定方向放置的检查对象物71;以及(E)使配置有检查对象物71的气氛成为高纯度的惰性气体气氛的气体供给装置80。在异物检查方法中,将被检查物所处的气氛设定为高纯度惰性气体气氛,并且在沿预定方向移动被检查物的同时,用具有一定波长的激光对被检查物的表面进行处理。并且检测在其表面上反射和衍射的光,以检测存在于待检查对象的表面上的异物。

著录项

  • 公开/公告号KR950034474A

    专利类型

  • 公开/公告日1995-12-28

    原文格式PDF

  • 申请/专利权人 오가 노리오;

    申请/专利号KR19950006646

  • 发明设计人 이시마루 도시유끼;

    申请日1995-03-28

  • 分类号H01L21/027;

  • 国家 KR

  • 入库时间 2022-08-22 03:46:03

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