A method of simulating electrical characteristics of a semiconductor device and an input data generating device for simulating electrical characteristics of the semiconductor device

摘要

It is an object of the present invention to provide a technique suitable for simulation for a semiconductor device, for example, data necessary for simulation such as wiring capacity and current density of a semiconductor device, A method of simulating electric characteristics of a semiconductor device which can be reused as data, accurate data to be written, and shortening of a working time, and an input data generating device used therefor. This configuration is a simulation method for simulating the electrical characteristics of a semiconductor device. The simulation method includes a step 1 for designating a material, an electrical characteristic, and a shape of a part to be inspected of the semiconductor device, An input data generation device for simulation that selects and designates among models, and a simulation method using this data.