首页> 外国专利> A process for preventing the re - deposition of etching products on substrate surfaces during the tungsten - etch back process, in the production of highly integrated circuits

A process for preventing the re - deposition of etching products on substrate surfaces during the tungsten - etch back process, in the production of highly integrated circuits

机译:一种在高集成电路生产中防止钨回蚀过程中蚀刻产物在基板表面重新沉积的工艺

摘要

during the ru00fccku00e4tzung, the substrate by means of a substratrand arranged on halteringes against a cooled probenaufnehmer pressed.this haltering erfindungsgemu00e4u00df is modified so that the substratrand only locally by the ru00fcckstaufrei at these points to the ru00fccku00e4tzung released u00e4tzprodukten trained haltering is kept, so that the u00e4tzprodukte at stops vorbeistru00f6men and s. ielt outside the substrate surface are separated.
机译:在r u00fcck u00e4tzung期间,通过将基板悬挂在吊带上,将基板压在冷却的探针上,使该吊带的erfindungsgem u00e4 u00df进行修改,以便仅通过r u00fcckstaufrei在这些点上局部固定基板 u00fcck u00e4tzung释放 u00e4tzprodukten训练的挂脖得以保留,因此vorbeistr和s停靠点处的 u00e4tzprodukte。基板表面外侧的分离。

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