Thermal fatigue testing using plural test trips with graduated sizing and recessed anchoring

摘要

A plurality of fatigue life test strips (16, 18, 20, 22) has each of the strips anchored to a base (12) which is subject to thermal cycling and consequent dimensional change which causes fatigue. The base is, at best, semiconductive, and the strips are conductive. The conductivity of each of the strips is measured by test circuit (52) so that, when one fails due to fatiguing, the failure is signaled.