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Techniques for mounting semiconductor dies in die-receiving areas having support structure having notches

机译:在具有带有凹口的支撑结构的芯片接收区域中安装半导体芯片的技术

摘要

In cases where there are at least some large gaps between edges of a semiconductor die and the inner ends of package conductors defining a die- receiving area, one or more bond wire support structure are disposed in the gap, thereby causing a long bond wire to behave as two or more shorter bond wires. The bond wires are tacked to a top surface of the support structure by various alternative means. Alternatively, a "jumper" structure having conductive traces of graduated length can be disposed in the die-receiving area between the die and the edges of the die-receiving area, providing an intermediate connection between the die and the leads of the package, thereby permitting short bond wires to be used in lieu of long bond wires.
机译:在半导体管芯的边缘与定义管芯接收区域的封装导体的内端之间至少有一些大间隙的情况下,一个或多个键合线支撑结构会放置在该间隙中,从而导致长键合线表现为两条或更多条较短的键合线。通过各种替代方式将键合线固定到支撑结构的顶表面。或者,可以在管芯与管芯接收区域的边缘之间的管芯接收区域中设置具有渐变长度的导电迹线的“跳线”结构,从而在管芯与封装的引线之间提供中间连接,从而允许使用短焊线代替长焊线。

著录项

  • 公开/公告号US5561086A

    专利类型

  • 公开/公告日1996-10-01

    原文格式PDF

  • 申请/专利权人 LSI LOGIC CORPORATION;

    申请/专利号US19950412597

  • 发明设计人 MICHAEL D. ROSTOKER;

    申请日1995-03-27

  • 分类号H01L21/48;

  • 国家 US

  • 入库时间 2022-08-22 03:37:49

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