首页> 外国专利> CHANNEL STOPPING METHOD USED FOR THICK FIELD INSULATING REGION IN TRIPPLE-WELL STRUCTURE

CHANNEL STOPPING METHOD USED FOR THICK FIELD INSULATING REGION IN TRIPPLE-WELL STRUCTURE

机译:梯形井结构中厚层绝缘区的通道止动方法

摘要

PROBLEM TO BE SOLVED: To obtain a thick field insulating region which is manufactured easily and whose size can be reduced easily by a method wherein channel stopping impurities are implanted through the thick field insulating region, at different energy levels and in a plurality of implantation quantities. ;SOLUTION: In order to electrically insulate at least one pair of first- conductivity-type source/drain diffusion parts 11, 12, the source/drain diffusion parts 11, 12 are formed inside a first second-conductivity-type well, and the first well is formed inside a second first-conductivity-type well. In this case, a thick field insulating region 23 is formed on the first well between the pair of source/drain diffusion parts 11, 12. Then, second-conductivity-type impurities in a first implantation quantity are implanted selectively into the first well through the thick field insulating region 23 at a first energy level. In addition, second-conductivity-type impurities in a second implantation quantity are implanted selectively into the first well through the thick field insulating region 23 at a second energy level.;COPYRIGHT: (C)1997,JPO
机译:要解决的问题:为了获得易于制造并且易于通过减小沟道尺寸的杂质的方法,在该方法中,以不同的能级和多个注入量将沟道阻挡杂质注入到厚场绝缘区域中。 。 ;解决方案:为了使至少一对第一导电类型的源/漏扩散部分11、12电绝缘,在第一第二导电类型的阱内部形成源/漏扩散部分11、12,并且第一阱形成在第二第一导电类型的阱内部。在这种情况下,在一对源/漏扩散部分11、12之间的第一阱上形成厚场绝缘区23。然后,通过第一注入量选择性地将第二导电类型的杂质通过第一阱注入到第一阱中。厚场绝缘区23处于第一能级。另外,第二注入量的第二导电型杂质以第二能级通过厚场绝缘区域23选择性地注入到第一阱中。;版权:(C)1997,JPO

著录项

  • 公开/公告号JPH09181162A

    专利类型

  • 公开/公告日1997-07-11

    原文格式PDF

  • 申请/专利权人 TEXAS INSTR INC TI;

    申请/专利号JP19960283698

  • 发明设计人 MEHRAD FREIDOON;

    申请日1996-10-25

  • 分类号H01L21/76;H01L21/8234;H01L27/088;

  • 国家 JP

  • 入库时间 2022-08-22 03:36:24

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