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NFM INTEGRATED TYPE MICROSCOPE

机译:NFM集成型显微镜

摘要

PROBLEM TO BE SOLVED: To conduct, on occasion, the observation of the whole sample and NFM observation like light-visual-field observation and phase difference observation. SOLUTION: This microscope has an NFM probe N, a 1st light convergence system for converging luminous flux of the center part of illumination luminous flux from a light source S on the incidence end of the NFM probe N, and a 2nd light convergence system which converges luminous flux of the peripheral part of the illumination luminous flux from the light source S on the sample. An NFM observation image formed on the basis of intensity information on the light from the sample O corresponding to the illumination light emitted from the pointed end of the NFM probe N is observed and an observation image of the whole sample formed on the basis of the light from the sample O corresponding to the illumination light converged on the sample O is observed.
机译:解决的问题:有时进行整个样品的观察和NFM观察,例如光视野观察和相差观察。解决方案:该显微镜具有NFM探头N,用于将来自光源S的照明光束的中心部分的光通量聚集在NFM探头N的入射端的第一聚光系统,以及会聚的第二聚光系统。来自样品上的光源S的照明光束的周边部分的光束。观察基于强度信息形成的与来自NFM探针N的尖端的照明光相对应的,来自样品O的光的NFM观察图像,并且基于该光形成的整个样品的观察图像从样品O观察到对应于会聚在样​​品O上的照明光的样品。

著录项

  • 公开/公告号JPH09203864A

    专利类型

  • 公开/公告日1997-08-05

    原文格式PDF

  • 申请/专利权人 NIKON CORP;

    申请/专利号JP19960031430

  • 发明设计人 OTAKI TATSURO;

    申请日1996-01-25

  • 分类号G02B21/06;G01B11/30;G01N37/00;

  • 国家 JP

  • 入库时间 2022-08-22 03:31:29

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