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Probe for locating electrical conductors that are not electrically accessible at the point of measurement
Probe for locating electrical conductors that are not electrically accessible at the point of measurement
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机译:用于定位在测量点不可触及的电导体的探头
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摘要
The probe for locating electrical conductors that are not electrically accessible at the point of measurement comprises means for selective sampling of the electric and magnetic fields radiated by the conductors under examination; means for automatically selecting the intensity of the prevailing field and then displaying the intensity of the prevailing field; the said automatic selection permitting evaluation of the presence of the conductor (prevailing electric field), the presence of short circuits or the presence of breaks in the conductor. IMAGE
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