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Probe for locating electrical conductors that are not electrically accessible at the point of measurement

机译:用于定位在测量点不可触及的电导体的探头

摘要

The probe for locating electrical conductors that are not electrically accessible at the point of measurement comprises means for selective sampling of the electric and magnetic fields radiated by the conductors under examination; means for automatically selecting the intensity of the prevailing field and then displaying the intensity of the prevailing field; the said automatic selection permitting evaluation of the presence of the conductor (prevailing electric field), the presence of short circuits or the presence of breaks in the conductor. IMAGE
机译:用于定位在测量点处不可电接触的电导体的探针包括:用于选择性地采样由检查的导体辐射的电场和磁场的装置;自动选择主场的强度然后显示主场的强度的装置;所述自动选择允许评估导体的存在(普遍的电场),导体中是否存在短路或断裂。 <图像>

著录项

  • 公开/公告号IT1276550B1

    专利类型

  • 公开/公告日1997-11-03

    原文格式PDF

  • 申请/专利权人 CAPODARCO ELETTRONICA SOC. COOP. A R.L.;

    申请/专利号IT1995RM00267

  • 发明设计人 PALUDOSI MARIO;

    申请日1995-04-27

  • 分类号

  • 国家 IT

  • 入库时间 2022-08-22 03:24:57

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