PROCEDURES FOR TESTING INTEGRATED HALF-CHARACTERISTICS INTEGRATED ON PLANTS AND USE OF A TRANSIT TEST FOR THIS PROCEDURE

摘要

A method for testing a semiconductor integrated circuit soldered into a printed circuit board makes use of the existence of parasitic transistors which occur on integrated circuits having diodes formed thereon. The method includes applying a voltage across the pins of the integrated circuit to be tested, measuring currents resulting from the voltage applied across the pins of the integrated circuit, connecting a transistor tester to selected pins of the integrated circuit, and determining typical control or switching characteristics of a parasitic transistor (1T, 2T) of the semiconducting integrated circuit (IC1, IC2). A commercial transistor tester is usable to perform the method.