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A METHOD FOR TESTING AN ELECTRONIC CIRCUIT BY LOGICALLY COMBINING CLOCK SIGNALS, AND AN ELECTRONIC CIRCUIT PROVIDED WITH FACILITIES FOR SUCH TESTING
A METHOD FOR TESTING AN ELECTRONIC CIRCUIT BY LOGICALLY COMBINING CLOCK SIGNALS, AND AN ELECTRONIC CIRCUIT PROVIDED WITH FACILITIES FOR SUCH TESTING
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机译:一种通过逻辑上结合时钟信号来测试电子电路的方法,以及一种具有进行这种测试的功能的电子电路
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摘要
An electronic circuit has a plurality of nodes at which a plurality of clock signals are present in operational use. The clock signals should have a pre-determined timing relationship amongst themselves. The circuit includes logic circuitry having inputs connected to the nodes and having an output to provide a pulse train. Any discrepancy between the actual and ideal pulse trains indicates a fault.
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