APPARATUS FOR INPUTTING 2-TEST DATA INPUT TO INTEGRATED CIRCUIT IN A BOUNDARY-SCAN ARCHITECTURE

摘要

a processor(10) for boundary scanning of an integrated circuit by providing the functions of an address bus, a data bus and a control bus; an IO address decoder(20) to input TDI signal to the integrated circuit by outputting IO address signal by decoding IO signal from the processor(10); a first TDI signal for storing path selective part(30) for selecting a path to store TDI signal; a first storing part(40) for storing TDI signal; an oscillator(50) for generating a clock; a TDI signal number setting part(60) for setting the number of TDI signal generated in one boundary scanning; a second TDI signal storing path selection part(70) for outputting each selected signal to store each TDI signal separated; and a second storing part(80) for outputting TDI signal of the first storing part(40) before the next boundary scanning.