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Manufacturing method of InP-based communication laser diode

机译:InP基通信激光二极管的制造方法

摘要

The present invention relates to a method of manufacturing an InP-based communication laser diode. More particularly, the present invention relates to a method for manufacturing an InP-based laser diode, Instead of the etchant, a brominated chlorine-2The present invention relates to a manufacturing method of an InP-based communication laser diode that can simplify an overall manufacturing process by omitting a process for forming and removing a thin film. In the case of an InP-based communication laser diode manufacturer, By using a brominated chloride-based etching solution instead of the etching solution,2InP substrate, an InGaAsP layer, a p-InP layer, a P-InP layer, a P-InP layer, and a P-InP layer are formed on an n-InP substrate,+-InGaAsP layer, the DH structure wafer is etched in a sulfuric acid-based etching solution to form a P-type GaN layer on the upper surface of the substrate,+-InGaAsP; a step of applying a photoresist (PR) to the upper structure (p-InP layer) obtained through the selective etching step; a step of applying a photoresist A DH surface etching step of etching a substrate having a double hetero structure obtained through the step of developing the surface of the substrate with a chlorine bromide (HBr) etching solution; And a photoresist film removing step of removing the photoresist film from the substrate obtained through this DH wafer etching step.
机译:本发明涉及一种制造基于InP的通信激光二极管的方法。更具体地,本发明涉及一种基于InP的激光二极管的制造方法,代替蚀刻剂,溴化氯- 2 。本发明涉及基于InP的通信的制造方法。通过省略形成和去除薄膜的过程可以简化整个制造过程的激光二极管。对于基于InP的通信激光二极管制造商,通过使用基于溴化氯的蚀刻溶液代替蚀刻溶液, 2 InP衬底,InGaAsP层,p-InP层,在n-InP衬底上形成P-InP层,P-InP层和P-InP层, + -InGaAsP层,在硫酸基中蚀刻DH结构晶片蚀刻溶液以在衬底的上表面上形成P型GaN层, + -InGaAsP;将光刻胶(PR)施加到通过选择性蚀刻步骤获得的上部结构(p-InP层)上的步骤;施加光致抗蚀剂的步骤DH表面蚀刻步骤是通过用溴化氯(HBr)蚀刻溶液对基板表面进行显影的步骤来蚀刻具有双异质结构的基板的步骤。并且是从通过该DH晶片蚀刻步骤获得的基板去除光致抗蚀剂膜的光致抗蚀剂膜去除步骤。

著录项

  • 公开/公告号KR960039504A

    专利类型

  • 公开/公告日1996-11-25

    原文格式PDF

  • 申请/专利权人 권문구;

    申请/专利号KR19950008621

  • 发明设计人 구본조;정낙진;송준석;

    申请日1995-04-13

  • 分类号H01S3/18;

  • 国家 KR

  • 入库时间 2022-08-22 03:18:53

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