On-line management of wafer automatic tester

摘要

The present invention detects all the information of the wafer production status on-line by automatically detecting the down-track of the equipment in the wafer production line, thereby detecting problems in the production environment early, and thereby improving the productivity and the product yield The present invention relates to a method for on-line management of an automatic tester in a wafer production line, which uses a user OIC program of a test program to check and record the status of a prober before execution of a test, And a second step of automatically installing the test program in the command file after the first step and recording the equipment status in the guide file and transmitting the test result to the host, and calling and executing the test main program and the user OIC program.