首页> 外国专利> Reduction of the probability of interlevel oxide failures by minimization of lead overlap area through bus width reduction

Reduction of the probability of interlevel oxide failures by minimization of lead overlap area through bus width reduction

机译:通过减少总线宽度,通过最小化引线重叠面积来减少层间氧化物失效的可能性

摘要

A field emission display apparatus is comprised of an emitter plate 2 comprising a plurality of column conductors 9 intersecting a plurality of row conductors 6, and electron emitters 5 at the intersection of each of the row and column conductors. An anode plate 62 is adjacent to the emitter plate 2, the anode plate 62 comprising conductive stripes 50 which are alternately covered by material luminescing in the three primary colors. The conductive stripes 50 covered by the same luminescent material are electrically interconnected to form comb-like structures corresponding to each of the colors. The anode plate 62 contains an active region 58 and the buses 82, 84, 86 have a non-uniform width.
机译:场致发射显示装置包括:发射极板2,其包括与多个行导体6相交的多个列导体9;和在每个行导体和列导体的相交处的电子发射器5。阳极板62与发射极板2相邻,阳极板62包括导电条50,导电条50交替地由三种原色的材料发光覆盖。被相同的发光材料覆盖的导电条50电互连以形成与每种颜色相对应的梳状结构。阳极板62包含有源区域58,并且汇流条82、84、86具有不均匀的宽度。

著录项

  • 公开/公告号US5598057A

    专利类型

  • 公开/公告日1997-01-28

    原文格式PDF

  • 申请/专利权人 TEXAS INSTRUMENTS INCORPORATED;

    申请/专利号US19950402596

  • 发明设计人 KENNETH G. VICKERS;

    申请日1995-03-13

  • 分类号H01J1/62;

  • 国家 US

  • 入库时间 2022-08-22 03:10:43

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