首页>
外国专利>
Reduction of the probability of interlevel oxide failures by minimization of lead overlap area through bus width reduction
Reduction of the probability of interlevel oxide failures by minimization of lead overlap area through bus width reduction
展开▼
机译:通过减少总线宽度,通过最小化引线重叠面积来减少层间氧化物失效的可能性
展开▼
页面导航
摘要
著录项
相似文献
摘要
A field emission display apparatus is comprised of an emitter plate 2 comprising a plurality of column conductors 9 intersecting a plurality of row conductors 6, and electron emitters 5 at the intersection of each of the row and column conductors. An anode plate 62 is adjacent to the emitter plate 2, the anode plate 62 comprising conductive stripes 50 which are alternately covered by material luminescing in the three primary colors. The conductive stripes 50 covered by the same luminescent material are electrically interconnected to form comb-like structures corresponding to each of the colors. The anode plate 62 contains an active region 58 and the buses 82, 84, 86 have a non-uniform width.
展开▼