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System for optically measuring the surface contour of a part using more fringe techniques

机译:使用更多条纹技术光学测量零件表面轮廓的系统

摘要

An optical measuring system comprises an illumination arrangement including a light source, grating, and lens, and an image acquisition arrangement, including a lens, grating, and camera. A mechanical translation device moves the grating in a plane parallel to a reference surface to effect a phase shift of a projected image of the grating on the contoured surface to be measured. A second mechanical translation device moves the lens to effect a change in the contour interval. A first phase of the points on the contoured surface is taken, via a four- bucket algorithm, at a first contour interval. A second phase of the points is taken at a second contour interval. A controller, including a computer, determines a coarse measurement using the difference between the first and second phases. The controller further determines a fine measurement using either the first or second phase. The displacement or distance, relative to the reference plane, of each point is determined, via the controller, using the fine and coarse measurements.
机译:光学测量系统包括:照明装置,其包括光源,光栅和透镜;以及图像采集装置,其包括透镜,光栅和照相机。机械平移装置在平行于参考表面的平面内移动光栅,以实现光栅在待测轮廓表面上的投影图像的相移。第二机械平移装置移动透镜以实现轮廓间隔的改变。经由四桶算法以第一轮廓间隔获取轮廓表面上的点的第一阶段。这些点的第二阶段以第二轮廓间隔取得。包括计算机的控制器使用第一和第二相之间的差来确定粗略测量。控制器还使用第一阶段或第二阶段确定精细测量。每个点相对于参考平面的位移或距离都可以通过控制器使用精细和粗略的测量值来确定。

著录项

  • 公开/公告号US5636025A

    专利类型

  • 公开/公告日1997-06-03

    原文格式PDF

  • 申请/专利权人 MEDAR INC.;

    申请/专利号US19940262130

  • 发明设计人 LEONARD H. BIEMAN;MARK A. MICHNIEWICZ;

    申请日1994-06-17

  • 分类号G01B11/24;G01B11/00;

  • 国家 US

  • 入库时间 2022-08-22 03:09:58

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