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Self-testable digital signal processor and method for self- testing of integrating circuits including DSP data paths
Self-testable digital signal processor and method for self- testing of integrating circuits including DSP data paths
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机译:可自测试的数字信号处理器和用于包括DSP数据路径的集成电路的自测试方法
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摘要
A self-testable Digital Signal Processing (DSP) integrated circuit is described, using a Built-In Self Test (BIST) scheme suitable for high performance DSP datapaths. The BIST session is controlled via hardware without the need for a separate test pattern generation register or test program storage. Furthermore, the BIST scenario is appropriately set-up so as to also test the register file as well as the shift and truncation logic in the datapath. The use of DataPath-BIST enables a very high speed test (one test vector is applied per clock cycle) with no performance degradation and little area overhead for the hardware test control. Comparison between DP-BIST and scan-based BIST technique is also presented. DP-BIST is used a centralized test resource to test other macros on the chip and the integration of DP-BIST with internal scan and boundary scan is addressed.
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