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METHOD OF DETECTING FLUORINE BY USE OF HIGH FREQUENCY GLOW DISCHARGE

机译:高频辉光放电检测氟的方法

摘要

PROBLEM TO BE SOLVED: To detect whether fluorine element is contained in a matter to be spectrally analyzed such as semiconductor product or not. ;SOLUTION: As an inert gas to be injected to a high frequency glow discharge device, neon gas is used. MgF2 contains fluorine in a ratio of 61.3%. The graph showing the result of spectral analysis of MgF2 (NO.1) shows that the peak of luminescent line having the largest intensity is present in 6856.02 Å, and luminescent lines are further generated in positions such as 6909.82 Å, 6902.46 Å, 6870.22 Å, 6834.26 Å, 6700 Å and the like. From this result of spectral analysis, the luminous intensity is high when fluorine is contained in large quantities to generate a pattern of large and small luminescent lines as described above. When fluorine is contained in small quantities, whether the luminescent line can be detected in 6856.01 Å having the highest intensity or not is the limit of detection sensitivity.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:检测要光谱分析的物质(例如半导体产品)中是否包含氟元素。 ;解决方案:作为注入高频辉光放电设备的惰性气体,使用了氖气。 MgF 2 含氟率为61.3%。显示MgF 2 (NO.1)的光谱分析结果的图表明,在6856.022中存在强度最大的发光线的峰,并且在这样的位置进一步产生发光线。分别为6909.82Å,6902.46Å,6870.22Å,6834.26Å,6700Å等等。根据该光谱分析的结果,如上所述,当大量地包含氟时,发光强度高,生成发光线的大小图案。当氟含量少时,是否可以在6856.011中检测到发光线。是否具有最高强度是检测灵敏度的极限。版权所有:(C)1998,日本特许厅

著录项

  • 公开/公告号JPH10281997A

    专利类型

  • 公开/公告日1998-10-23

    原文格式PDF

  • 申请/专利权人 ATAGO BUSSAN KK;

    申请/专利号JP19970110345

  • 发明设计人 SHIMIZU RYOSUKE;

    申请日1997-04-11

  • 分类号G01N21/67;

  • 国家 JP

  • 入库时间 2022-08-22 03:08:06

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