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ETCHING PROCESS CONTROL METHOD FOR THIN SHEET METALLIC MATERIAL AND QUALITY ASSURANCE METHOD FOR ETCHED PRODUCT

机译:薄板金属材料的蚀刻过程控制方法和制品的质量保证方法

摘要

PROBLEM TO BE SOLVED: To provide a process control method for the etching process of thin sheet metallic materials, such as shadow masks and lead frames and a quality assurance method for etching products. ;SOLUTION: The rapid and suitable process control is made by controlling the process for measuring the shapes of the etched parts of etched products of the thin sheet metallic materials by a scanning type laser microscope and the process for displaying the measurement data as three-dimensional images by image processing computation and the process conditions of the etching process in accordance with the results of the image display. The image display data id preserved as digital data, by which the data is made helpful for the quality assurance of the etched products.;COPYRIGHT: (C)1998,JPO
机译:要解决的问题:提供用于薄金属板材料(例如荫罩和引线框架)的蚀刻过程的过程控制方法以及蚀刻产品的质量保证方法。 ;解决方案:通过控制通过扫描型激光显微镜测量薄金属片蚀刻产品的蚀刻部分的形状的过程以及将测量数据显示为三维的过程,可以进行快速而适当的过程控制根据图像显示的结果,通过图像处理计算和蚀刻处理的处理条件对图像进行显示。图像显示数据id保留为数字数据,从而使数据有助于蚀刻产品的质量保证。;版权所有:(C)1998,日本特许厅

著录项

  • 公开/公告号JPH10158864A

    专利类型

  • 公开/公告日1998-06-16

    原文格式PDF

  • 申请/专利权人 DAINIPPON PRINTING CO LTD;

    申请/专利号JP19960331405

  • 发明设计人 YAMAMOTO TAKAHIKO;

    申请日1996-11-28

  • 分类号C23F1/08;G01B11/24;H01J9/14;H01L23/50;

  • 国家 JP

  • 入库时间 2022-08-22 03:07:35

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