CREEP LIFETIME EVALUATING METHOD FOR HIGH TEMPERATURE APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a creep lifetime evaluating method for a high temperature apparatus which can obtain reliable data with a small number of samples in a short test time. ;SOLUTION: A plurality of thermocouples 4 are mounted on a parallel portion of a test piece 3 in an axially spaced-apart manner. The temperature distribution on the entire parallel portion of the test piece 3 is estimated from temperatures monitored by these thermocouples 4. Upon completion of a rupture test, a creep damage rate on at least one portion of the parallel portion with an exception of the ruptured portion is obtained by observing a change in micro structure thereof and a change in hardness thereof. The rupture time is estimated from the creep damage rate and the creep test time, and the relationship between the rupture time and the operation temperature is obtained from the rupture portion and the change in the microstructure and hardness.;COPYRIGHT: (C)1998,JPO