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METHOD FOR CALCULATING INTENSITY OF SPECTRAL LINE OF FLUORESCENT X-RAY

机译:荧光X射线谱线强度的计算方法

摘要

PROBLEM TO BE SOLVED: To more accurately calculate the intensities of the spectral lines of different elements contains in the same peak of a spectral waveform with a fluorescent X-ray analyzer. SOLUTION: By finding the position CP and intensity IP of a peak P containing the spectral lines PA and PB of different elements A and B in advance, the positions CA and CB of the wavelength and intensities IA and IB of the spectral lines PA and PB are estimated and the shapes of the spectral lines PA and PB functionally approximated based on the estimated values. Then the intensities IPA and IPB of the spectral lines PA and PB at the position of the peak CP are estimated and corrected by constantly maintaining the ratio between the intensities IPB so that the sum of the intensities IPA and IPB many coincident with the peal intensity IP and the corrected values IPA' and IPB' are outputted as the intensity values of the spectral lines A and B.
机译:解决的问题:为了更准确地计算荧光X射线分析仪在光谱波形的同一峰中包含的不同元素的光谱线的强度。解决方案:通过预先找到包含不同元素A和B的光谱线PA和PB的峰P的位置CP和强度IP,可以确定波长的位置CA和CB以及光谱线PA和PB的强度IA和IB估计谱线,并基于估计值在功能上近似估计谱线PA和PB的形状。然后,通过不断地保持强度IPB之间的比率,估算和校正峰CP处光谱线PA和PB的强度IPA和IPB,以使强度IPA和IPB的总和与果皮强度IP一致输出校正值IPA'和IPB'作为谱线A和B的强度值。

著录项

  • 公开/公告号JPH10197457A

    专利类型

  • 公开/公告日1998-07-31

    原文格式PDF

  • 申请/专利权人 SHIMADZU CORP;

    申请/专利号JP19970000663

  • 发明设计人 SHIODA TADAHIRO;

    申请日1997-01-07

  • 分类号G01N23/223;

  • 国家 JP

  • 入库时间 2022-08-22 03:05:27

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