首页> 外国专利> VAPOR PHASE GROWTH OF COMPOUND SEMICONDUCTOR THIN FILM AND VAPOR PHASE GROWTH APPARATUS BASED THEREON

VAPOR PHASE GROWTH OF COMPOUND SEMICONDUCTOR THIN FILM AND VAPOR PHASE GROWTH APPARATUS BASED THEREON

机译:复合半导体薄膜的汽相生长及其所基于的汽相生长装置

摘要

PROBLEM TO BE SOLVED: To provide a method, prior to vapor phase growth of a compound semiconductor thin film, for enabling removal of such an unnecessary layer as an impurity or oxide film adhered or formed onto a compound semiconductor substrate or onto a crystal of the compound semiconductor thin film formed on the substrate, and simultaneously enabling suppression of re-evaporation of a family-V element having a high vapor pressure to prevent deterioration of surface morphology. ;SOLUTION: In the method, a compound semiconductor substrate containing family-V elements or a substrate having a compound semiconductor thin film containing family-V elements and formed thereon is processed using of a dissociation gas produced from an organic family-V compound expressed by a following formula: (Formula 1) where R1, R2 and R3 denote an identical or different alkyl groups or hydrogen atom, at last one of R1, R2 and R3 denotes an alkyl group, and V denotes a family-V atom.;COPYRIGHT: (C)1998,JPO
机译:解决的问题:提供一种在化合物半导体薄膜的气相生长之前的方法,该方法能够去除不必要的层,例如粘附或形成在化合物半导体衬底或晶体上的杂质或氧化物膜。在衬底上形成的化合物半导体薄膜,同时能够抑制具有高蒸汽压的V族元素的再蒸发,以防止表面形态的恶化。 ;解决方案:在该方法中,使用由V族表示的有机V族化合物产生的离解气体处理含有V族元素的化合物半导体衬底或在其上形成了具有V族元素化合物半导体薄膜的衬底。下式:(式1)其中,R 1 ,R 2 和R 3 表示相同或不同的烷基或氢原子, R 1 ,R 2 和R 3 的最后一个表示烷基,V表示V族原子。 C)1998,日本特许厅

著录项

  • 公开/公告号JPH10233366A

    专利类型

  • 公开/公告日1998-09-02

    原文格式PDF

  • 申请/专利权人 SHARP CORP;

    申请/专利号JP19970036323

  • 发明设计人 ATSUNUSHI FUMIHIRO;

    申请日1997-02-20

  • 分类号H01L21/205;C30B25/02;C30B29/40;H01L21/3065;H01L33/00;H01S3/18;

  • 国家 JP

  • 入库时间 2022-08-22 03:04:54

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号