Automatic flaw detection device and automatic flaw detection manner null of finish adding

摘要

PURPOSE:To make it possible to detect flaws automatically at high efficiency by mounting a material to be inspected on a rotary supporting stage, rotating the material at a constant speed, and photographing the microscope-expanded image of the material to be inspected. CONSTITUTION:A rotary supporting stage 1 is formed of a mounting stage and a turntable. The turntable on which a material to be inspected D is mounted is rotated at a constant speed. Every one material to be inspected D is rotated by three rotations. A microscope camera 3 is fixed to the upper part of a main body 2 of a microscope so that the camera 3 can be freely removed. The expanded image of the specified region of the material to be measured D which is expanded by the main body 2 is picked up. The so-called monochrome image signal is outputted to an image display device 7. The image signal is outputted into a computer 8 directly or through the device 7. In the computer 8, the monochrome image signal outputted from the camera 3 is processed into numerical values in correspondence with the degrees of the white color or the black color. The numerically processed data are used, and the processing of the various data such as the presence or absence and the degrees of the flaws and the positions and the number of the flaws are processed.