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Position detection device by fan-shaped Fresnel zone plate using multi-wavelength illumination

机译:扇形菲涅耳波带片采用多波长照明的位置检测装置

摘要

PURPOSE:To accurately detect the positions of a mask and a wafer by providing an alignment mark made of a sector-shaped Fresnel zone plate(SFZP) on each article, and irradiating the SFZP simultaneously with a light having a plurality of wavelengths from the same direction. CONSTITUTION:An illumination optical device 5 combines a laser light having a wavelength lambda1 from a laser 1 and a laser light having a wavelength lambda2 (lambda1lambda2) by a beam splitter 2, and reflects it as a parallel beam obliquely downward by a mirror 4 to radiate it. A detecting optical device 10 has an objective lens 9 having an axial chromatic aberration. The lens 9 has different focal distances of the lights having the wavelengths lambda1 and lambda2, brings the focal points having different positions of the alignment mark 16 of a mask 14 made of SLZP and the alignment mark 17 of a wafer 15 according to the lights having the wavelengths lambda1, lambda2 into coincidence with those of the lens 9 of the lights having the lambda1, lambda2, superposed on a linear sensor 6 by a relay lens 8 to be imaged. A detection signal from the sensor 6 is detected at positions of the marks 16, 17 in a direction Y by a predetermined signal process.
机译:目的:通过在每个物品上提供由扇形菲涅耳波带片(SFZP)制成的对准标记,并同时用来自同一波长的多个波长的光照射SFZP,来准确地检测掩模和晶片的位置方向。组成:照明光学装置5将来自激光器1的波长为lambda1的激光和波长为lambda2(lambda1

著录项

  • 公开/公告号JP2709832B2

    专利类型

  • 公开/公告日1998-02-04

    原文格式PDF

  • 申请/专利权人 住友重機械工業株式会社;

    申请/专利号JP19880202857

  • 发明设计人 宮武 勤;

    申请日1988-08-15

  • 分类号H01L21/027;G01B11/00;G03F9/00;

  • 国家 JP

  • 入库时间 2022-08-22 02:59:23

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