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Use the deformation Fresnel zone plate position method of detection and the position detection device

机译:使用变形菲涅耳波带片的位置检测方法及位置检测装置

摘要

PROBLEM TO BE SOLVED: To make a diffraction image sharp, and improve the relative position detection accuracy of a mask to a wafer by forming a alignment mark into such a shape that the zone edge of each Fresnel zone is not like an inverted trapezoidal shape but the oblique sides bulge outward along the center axis. SOLUTION: An alignment mark in a position detector uses a deformed Fresnel zone plate 30 in which the zone edges E1-E7 of each of a plurality of Fresnel zones Z1-Z7 is not inverted trapezoidal but the oblique sides bulge outward arcuately along a center axis C2. By forming the shape of the Fresnel zone plate used for an alignment mark, the main focal plane of the Fresnel zone plate can be placed relatively nearer to the main focal plane of an objective of a detection optional set than in the normal inverted trapezoidal Fresnel zone plate, so that the diffraction image of the Fresnel zone plate is made sharp.
机译:解决的问题:通过将对准标记形成为每个菲涅耳区域的区域边缘不像倒梯形形状而是将对准标记形成为这样的形状,以使衍射图像清晰,并提高掩模相对于晶片的相对位置检测精度,从而可以解决问题。斜边沿中心轴向外凸出。解决方案:位置检测器中的对准标记使用变形的菲涅耳防区板30,其中多个菲涅耳区域Z1-Z7的每个区域边缘E1-E7都不是梯形倒置的,而是倾斜的边沿中心轴弧形向外凸出C2。通过形成用于对准标记的菲涅耳波带片的形状,可以将菲涅耳波带片的主焦平面放置成比正常的倒梯形菲涅耳波带相对更靠近检测可选装置的物镜的主焦平面。使菲涅耳波带片的衍射图像清晰。

著录项

  • 公开/公告号JP3286246B2

    专利类型

  • 公开/公告日2002-05-27

    原文格式PDF

  • 申请/专利权人 住友重機械工業株式会社;

    申请/专利号JP19980101763

  • 发明设计人 宮武 勤;

    申请日1998-03-31

  • 分类号H01L21/027;G01B11/00;

  • 国家 JP

  • 入库时间 2022-08-22 01:00:40

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