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STATISTICAL PROCESS CONTROL INTEGRATION SYSTEMS AND METHODS FOR MONITORING MANUFACTURING PROCESSES

机译:用于监视制造过程的统计过程控制集成系统和方法

摘要

A method and system (100) for monitoring process parameters associated with a manufacturing or testing process. The system (100) includes: at least one machine (101) which is used in the manufacturing or testing process; at least one sensing device (115), coupled to the at least one machine (101), for measuring a process parameter associated with the at least one machine (101); and a controller (DNM), coupled to the at least one sensing device (115), for receiving and storing measured data from the at least one sensing device (115). The method includes the acts of: measuring a value of a process parameter associated with a machine (101) used in the manufacturing or testing process; converting the measured value of the process parameter into a digital data signal having a specified data format; transmitting the digital data signal to a controller (DNM); and storing the digital data signal in a database.
机译:一种用于监视与制造或测试过程相关的过程参数的方法和系统(100)。系统(100)包括:至少一台用于制造或测试过程的机器(101);至少一感测装置(115),其耦接至该至少一台机器(101),用以量测与该至少一台机器(101)相关的过程参数;控制器(DNM),其耦合到至少一个感测设备(115),用于接收和存储来自至少一个感测设备(115)的测量数据。该方法包括以下动作:测量与在制造或测试过程中使用的机器(101)相关联的过程参数的值;将过程参数的测量值转换为具有指定数据格式的数字数据信号;将数字数据信号发送到控制器(DNM);将数字数据信号存储在数据库中。

著录项

  • 公开/公告号WO9833126A1

    专利类型

  • 公开/公告日1998-07-30

    原文格式PDF

  • 申请/专利权人 CIRCUIT IMAGE SYSTEMS;

    申请/专利号WO1998US01340

  • 发明设计人 KENNEY JIM;LEON JOHN;

    申请日1998-01-27

  • 分类号G06F17/00;G06F19/00;

  • 国家 WO

  • 入库时间 2022-08-22 02:51:25

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