首页> 外国专利> Process for the provision of metallized holes in dielectric substrates comprising interconnected thin film conductive and/or resistive paths

Process for the provision of metallized holes in dielectric substrates comprising interconnected thin film conductive and/or resistive paths

机译:在包括互连的薄膜导电和/或电阻路径的介电基片中提供金属化孔的方法

摘要

There is described a process for the provision of metallized holes in dielectric substrates comprising conductive (2) and/or resistive paths (3) belonging to hybrid circuits in thin film for microwave applications. The process comprises the steps of deposition of overlying layers of TaN (5), Ti (6) and Pd (7) on the front side, photomasking and deposition of gold (9) along predetermined paths, removal of TaN (5), Ti (6) and Pd (7) outside said paths (2,3), photoengraving of gold (9), Pd (7) and Ti (6) in correspondence of resistors (3), drilling in metal-free areas, vacuum sputtering of Ti (6') and Pd (7') on the front & back sides, deposition of negative photoresist (10) on the front side, photomasking of circular areas overlying the holes and overlying in part the conductive paths, development and galvanic growth of gold (11), elimination of the residual photoresist (10), selective chemical etching to eliminate the Pd (7') and Ti (6') in excess.
机译:描述了一种在介电基片中提供金属化孔的方法,该金属化孔包括属于微波应用薄膜中的混合电路的导电(2)和/或电阻路径(3)。该工艺包括以下步骤:在正面沉积TaN(5),Ti(6)和Pd(7)的覆盖层,沿预定路径进行光掩模和金(9)的沉积,去除TaN(5),Ti (6)和Pd(7)在所述路径(2,3)之外,对应电阻(3)的金(9),Pd(7)和Ti(6)的光雕刻,在无金属区域钻孔,真空溅射正面和背面的Ti(6')和Pd(7')的沉积,正面上的负性光刻胶(10)的沉积,覆盖孔和部分导电路径的圆形区域的光掩模,显影和电流增长金(11),残留的光致抗蚀剂(10)的去除,选择性化学蚀刻以去除过量的Pd(7')和Ti(6')。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号