the automatic test system of the semiconductor device to the transfer device.

摘要

according to the invention the semiconductor device according to the automatic test system of the transfer device, the stage it is the slider, the slider's dynamic control, the role of the channel, the uc2acub77cuc774ub354uc5d0 the stage action. axis with the magnetic core installed in the cover to be formed, the current flowing to the moving coil, air supply by itself is a form of jet nozzle with the slider in the channel, to send a copy to the the channel shaped and located between the slider and the slider are formed to the circuit breaker equipped with the automatic test system of the semiconductor device, the transfer device.the breaker is composed of a magnet (Magnet) and the breaker and is part of the life of the electrical conductor in the channel will be the characteristics.;according to the invention, the transfer device so that the breaker's wear adjust flow of the problem, stop, the function of micro vibration, reduce the required operation time can be reduced. effect.