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DRAM with edge sense amplifiers which are activated along with sense amplifiers internal to the array during a read cycle

机译:具有边沿感应放大器的DRAM,在读取周期内与阵列内部的感应放大器一起被激活

摘要

A staggered bitline sense amplifier architecture utilizes a circuit to simulate the effect of a memory cell on each of the edge sense amplifiers not selected for connection to an activated memory cell, thereby to allow the edge sense amplifiers to be activated simultaneously with the sense amplifiers internal to the memory array without the danger of burning out the edge sense amplifiers. This structure eliminates the address decoding circuitry commonly associated with the edge sense amplifiers used in staggered shared bitline sense amplifier architectures, thereby decreasing the complexity and reducing the chip size of such memory arrays.
机译:交错的位线感测放大器架构利用电路来模拟存储单元对未选择用于连接到激活的存储单元的每个边缘感测放大器的影响,从而允许边缘感测放大器与内部的感测放大器同时被激活连接到存储阵列,没有烧坏边缘检测放大器的危险。这种结构消除了通常与交错共享位线读出放大器体系结构中使用的边缘读出放大器相关的地址解码电路,从而降低了复杂度并减小了这种存储器阵列的芯片尺寸。

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