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POLISHING MOLDING, POLISHING LEVEL BLOCK AND POLISHING METHOD USING THIS POLISHING MOLDING
POLISHING MOLDING, POLISHING LEVEL BLOCK AND POLISHING METHOD USING THIS POLISHING MOLDING
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机译:抛光模,抛光块和使用该抛光模的抛光方法
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摘要
PROBLEM TO BE SOLVED: To provide a polishing molding capable of effective polishing work and a polishing surface plate and a polishing method using this polishing molding whereby waste fluid problem is reduced, a polishing workpiece can be efficiently polished, with a polishing finish of equal degree or more to the conventional method, in a work process polishing a substrate material of semiconductor substrate, oxidized object substrate, etc., of a silicon wafer or the like and an electronic related part of optical material or the like required for accurate work. ;SOLUTION: In a polishing molded unit composed of silica (silicon dioxide), alumina (aluminum oxide), and/or ceria (cerium oxide), bulky density is 0.2 to 3.5 g/cm3, BET specific surface area is 5 to 350 m2/g, and an average grain size is 0.001 to 0.5 μm. This silica is preferable 50 to 95 vol.% relating to the total unit of a polishing molding.;COPYRIGHT: (C)1999,JPO
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机译:解决的问题:为了提供一种能够有效地进行抛光工作的抛光成型品以及使用该抛光成型品的抛光面板和抛光方法,从而减少废液的问题,可以以相同程度的抛光完成度来高效地抛光抛光工件。在传统的方法中,在加工过程中抛光硅晶片等的半导体衬底,氧化对象衬底等的衬底材料以及精确加工所需的光学材料等的电子相关部分。 ;解决方案:在由二氧化硅(二氧化硅),氧化铝(氧化铝)和/或二氧化铈(氧化铈)组成的抛光成型单元中,堆积密度为0.2至3.5 g / cm 3 Sup>,BET比表面积为5-350m 2 Sup> / g,平均粒径为0.001-0.5μm。该二氧化硅相对于抛光成型品的总单位优选为50〜95体积%。COPYRIGHT:(C)1999,JPO
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