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Stress analysis system and its manner null for semiconductor package design

机译:应力分析系统及其在半导体封装设计中的作用

摘要

PURPOSE: To achieve an analysis using a plurality of models and finite element method simultaneously by providing a model for analysis and a material constant file for each type of semiconductor package. ;CONSTITUTION: When, for example, TWSOP(Thin Small Outline Package with Window, DIP type) package type is specified, it is possible to perform such editing as the additional input, rewriting, and deletion of a file where a fundamental model or a typical method of the fundamental model is registered and is also possible to store the created analysis model as one of the fundamental models and to re-utilize it. Also, when creating a plurality of models by changing dimensions, a plurality of models can be specified simultaneously by the number of rows by writing figures for a plurality of method requirements such as a line (e) and a line (i) at a line for entering dimensions. Therefore, it is not necessary to repeat creating models and the change in stress due to the change in designing requirements such as dimensions can be examined at a time.;COPYRIGHT: (C)1995,JPO
机译:目的:通过提供用于每种类型的半导体封装的分析模型和材料常数文件,同时使用多个模型和有限元方法来实现分析。 ;构成:例如,指定TWSOP(带有窗口的薄型小型轮廓包装,DIP类型)包装类型时,可以执行诸如基本文件或基本文件的附加输入,重写和删除文件之类的编辑。注册基本模型的典型方法,也可以将创建的分析模型存储为基本模型之一,然后重新使用它。而且,当通过改变尺寸来创建多个模型时,可以通过在行上写诸如线(e)和线(i)等多种方法要求的图形,通过行数同时指定多个模型。输入尺寸。因此,不必重复创建模型,并且可以一次检查由于设计要求(例如尺寸)的变化而引起的应力变化。;版权所有:(C)1995,JPO

著录项

  • 公开/公告号JP2972518B2

    专利类型

  • 公开/公告日1999-11-08

    原文格式PDF

  • 申请/专利权人 NIPPON DENKI KK;

    申请/专利号JP19940123422

  • 发明设计人 ISHIBASHI MASAHIRO;

    申请日1994-06-06

  • 分类号G01L1/00;G06F17/50;H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-22 02:31:07

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