首页> 外国专利> For Al alloy thin film formation for the reflected film of the optical type record media which is superior in composition uniformity make Al alloy sputtering target

For Al alloy thin film formation for the reflected film of the optical type record media which is superior in composition uniformity make Al alloy sputtering target

机译:组成均匀性优异的光学型记录介质的反射膜用铝合金薄膜形成用铝合金溅射靶

摘要

PURPOSE:To produce a thin Al alloy film which is used for reflecting film, etc., for optical recording medium and has high reflectivity, superior corrosion resistance, and low thermal conductivity and also has excellent uniformity of composition and superior productivity. CONSTITUTION:The film is a thin film of an Al alloy which has a composition containing, as alloy component, 0.1-15atomic% Mn or further 0.1-10atomic% of Hf and/or Ta. This thin Al alloy film is produced by forming the thin Al alloy film on a substrate by means of sputtering by using a refined Al alloy target which has a composition containing 0.1-15atomic% Mn or further 0.1-10 atomic% of Hf and/or Ta. This thin film can suitably be used for reflecting film for optical recording medium, and a recording medium excellent in recording sensitivity and durability and capable of maintaining high sensitiviey and high precision for a long period can stably be constituted with superior economic efficiency.
机译:用途:生产用于反射膜等的铝合金薄膜,该薄膜用于光学记录介质,具有高反射率,优异的耐腐蚀性和低导热性,还具有优异的组成均匀性和优异的生产率。组成:该膜是铝合金薄膜,其成分包含0.1-15原子%的Mn或0.1-10原子%的Hf和/或Ta作为合金成分。通过使用精炼的Al合金靶,通过溅射在基板上形成Al合金膜来制造该Al合金膜,该Al靶具有含有0.1-15原子%的Mn或进一步0.1-10原子%的Hf和/或助教。该薄膜可以适合用于光学记录介质的反射膜,并且可以以优异的经济效率稳定地构成记录灵敏度和耐久性优异并且能够长期保持高灵敏度和高精度的记录介质。

著录项

  • 公开/公告号JP2898112B2

    专利类型

  • 公开/公告日1999-05-31

    原文格式PDF

  • 申请/专利权人 KOBE SEIKOSHO KK;

    申请/专利号JP19910041651

  • 发明设计人 YOSHIKAWA KAZUO;OONISHI TAKASHI;

    申请日1991-03-07

  • 分类号C23C14/34;C22C21/00;G11B7/24;G11B7/26;G11B11/10;

  • 国家 JP

  • 入库时间 2022-08-22 02:30:29

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