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Uses polarization strength difference dispersion the grain size analysis

机译:采用极化强度差分散粒径分析

摘要

In a particle size measuring system, particles suspended in a sample cell (8') are illuminated by interrogating light beams (212) including a first interrogating component having a polarization parallel to a scattering plane, and a second interrogating component having a polarization perpendicular to the scattering plane. A photodetector (214) generates first and second intensity signals representative of the intensity, at various scattering angles, of scattered light corresponding to the first and second interrogating components. A processor (126) generates a difference signal representative of the difference between the first and second intensity signals, and calculates a resultant signal representative of particle size, based on a selected arithmetic transformation of the difference signal.
机译:在粒度测量系统中,通过询问光束(212)来照射悬浮在样品池(8')中的粒子,所述光束包括具有平行于散射平面的偏振的第一询问成分和具有垂直于散射平面的偏振的第二询问成分。散射平面。光电检测器(214)产生第一和第二强度信号,所述第一和第二强度信号表示在各种散射角下与第一和第二询问分量相对应的散射光的强度。处理器(126)基于选择的差异信号的算术变换,生成表示第一强度信号和第二强度信号之间的差异的差异信号,并计算表示粒径的结果信号。

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