首页> 外国专利> DUAL ENTRANCE WINDOW ION CHAMBER FOR MEASURING X-RAY EXPOSURE

DUAL ENTRANCE WINDOW ION CHAMBER FOR MEASURING X-RAY EXPOSURE

机译:双入口窗离子室,用于测量X射线照射

摘要

A dual entrance window ion chamber is provided forpurposes of measuring x-ray exposure. The ion chamberincludes a housing having a cavity formed therein and whichdefines an ion chamber. The housing has oppositelydisposed first and second openings therein located onopposite sides of the chamber. First and second x-rayentrance windows respectively cover the first and secondopenings for permitting entrance of x-rays into thechamber. A collector is located in the chamberintermediate the first and second windows for collection ofelectrons for use in measuring x-ray exposure. The firstand second windows are constructed differently from eachother such that the first window is optimized so that theion chamber provides a relatively flat energy response tox-rays over a first x-ray energy range. The second windowis optimized so that the ion chamber provides a relativelyflat energy response over a second x-ray energy range. Thesecond energy range is of a greater energy level than thatof the first energy range.
机译:提供了一个双入口窗口离子室,用于测量X射线曝光的目的。离子室包括具有在其中形成的腔的壳体,并且该壳体限定离子室。外壳有相反的位于其中的第一和第二开口位于室的相对两侧。第一和第二张X射线入口窗分别覆盖第一和第二允许X射线进入的开口室。收集器位于室内在第一窗口和第二窗口之间进行收集用于测量X射线曝光的电子。首先第二个窗口的结构各不相同其他,以便优化第一个窗口,以便离子室提供相对平坦的能量响应在第一个X射线能量范围内的X射线。第二个窗口经过优化,以使离子室提供相对在第二个X射线能量范围内的能量响应平坦。的第二能量范围具有比第二能量范围更大的能量水平第一能量范围。

著录项

  • 公开/公告号CA2163416C

    专利类型

  • 公开/公告日1999-02-23

    原文格式PDF

  • 申请/专利权人 KEITHLEY INSTRUMENTS INC.;

    申请/专利号CA19952163416

  • 发明设计人 LABBE MICHAEL STEVEN;

    申请日1995-11-21

  • 分类号G01T1/185;G01T1/02;

  • 国家 CA

  • 入库时间 2022-08-22 02:24:05

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