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METHOD FOR MANUFACTURING DEFECT-FREE COMPOUND SEMICONDUCTOR THIN FILM ON DIELECTRIC THIN FILM
METHOD FOR MANUFACTURING DEFECT-FREE COMPOUND SEMICONDUCTOR THIN FILM ON DIELECTRIC THIN FILM
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机译:在电介质薄膜上制造无缺陷复合半导体薄膜的方法
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摘要
The present invention relates to a method for producing a compound semiconductor semiconductor thin film having a defectless semiconductor lattice structure on a dielectric thin film.;The present invention is carried out on a multi-layered structure having a heterogeneous compound semiconductor thin film GaAs, InGaAs or InAs layer on the AlGaInAs-based thin film layer to which a high concentration of carbon impurity is added. According to the present invention, an effect of rapidly growing a thin film layer of a heterogeneous compound semiconductor on an Al 2 O 3 thin film layer as a dielectric without defects
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机译:本发明涉及在电介质薄膜上制造具有无缺陷的半导体晶格结构的化合物半导体半导体薄膜的方法。本发明是在具有异质化合物半导体薄膜GaAs,InGaAs的多层结构上进行的。或在AlGaInAs基薄膜层上的InAs层上添加了高浓度的碳杂质。根据本发明,在作为无缺陷的电介质的Al 2 Sub> O 3 Sub>薄膜层上快速生长异质化合物半导体的薄膜层的效果
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