Method of searching a critical pass and a searching system

摘要

Provided is a critical path search method and a search system capable of reliably detecting a critical path at high speed using an actual semiconductor device. The number of operating clocks from when predetermined data is input to the semiconductor device to output of corresponding data is set to n and each cycle of the n operating clocks is changed from a failing cycle to a cycle that is passed successively, Execute the search of the path.