Method of searching a critical pass and a searching system

摘要

PROBLEM TO BE SOLVED: To provide a critical path searching system for detecting a critical path accurately at high speed using an actual semiconductor device. ;SOLUTION: A semiconductor tester comprises a tester processor 10, a timing generator 20, a pattern generator 30, a data selector 40, a format control section 50, a pin card 60, and a digital comparing section 70. The tester processor 10 delivers a command to the timing generator 20 and operates a semiconductor device 100 by setting a partial period in (n) operating clocks after inputting a test data to the semiconductor device 100 before outputting a corresponding data therefrom at T2 and other period at T1. The digital comparing section 70 decides whether the output data is acceptable or not and the position of an operating clock having period T2 is searched as a critical path generating position if the semiconductor device 100 operates normally.;COPYRIGHT: (C)1999,JPO