首页> 外国专利> FOUR FREQUENCY MEASURING PROCESS FOUR COUPLED-DUAL RESONATOR CRYSTALS

FOUR FREQUENCY MEASURING PROCESS FOUR COUPLED-DUAL RESONATOR CRYSTALS

机译:四个频率测量过程四个耦合双谐振器晶体

摘要

In a third case or way of obtaining four threshold frequencies useful for accurately measuring a double bond resonator crystal, two ports of the crystal structure are monitored rather than a single port in a previously known case. Here, for example, the B port is monitored with the A-side open circuit or with the capacitor connected to itself in parallel, while the A port is monitored with the B-side short circuit.
机译:在获得用于精确测量双键谐振器晶体的四个阈值频率的第三种情况或方式中,监视晶体结构的两个端口,而不是在先前已知的情况下监视单个端口。在此,例如,通过A侧开路或并联连接的电容器来监视B端口,而通过B侧短路来监视A端口。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号