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MEASURING CIRCUIT TEST PROBE WITH SUB-PROBE PIN.
MEASURING CIRCUIT TEST PROBE WITH SUB-PROBE PIN.
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机译:用子探头针测量电路测试探头。
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摘要
The present invention relates to a circuit test rod for measuring instrument provided with an auxiliary probe pin for short-circuit prevention, so as to slide out of the body (1) while being in contact with the probe pin (2) installed inside the body (1) of the measuring instrument circuit test rod The auxiliary probe pin (3) is installed, the auxiliary probe pin (3) is connected to the lever (5) on the outside of the body (1) through the slit (4) formed in the longitudinal direction in the body (1) and the lever (5) ) To move along the slit (4) to move the auxiliary probe pin (3) to the outside of the body, so that the thickness of the thinner to check the narrow circuit contact pin inside the body of the circuit test rod By providing the auxiliary probe pin to be used separately, there is an excellent effect to be able to perform a stable circuit test even if the pin interval of the object to be measured.
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