首页> 外国专利> MEASURING CIRCUIT TEST PROBE WITH SUB-PROBE PIN.

MEASURING CIRCUIT TEST PROBE WITH SUB-PROBE PIN.

机译:用子探头针测量电路测试探头。

摘要

The present invention relates to a circuit test rod for measuring instrument provided with an auxiliary probe pin for short-circuit prevention, so as to slide out of the body (1) while being in contact with the probe pin (2) installed inside the body (1) of the measuring instrument circuit test rod The auxiliary probe pin (3) is installed, the auxiliary probe pin (3) is connected to the lever (5) on the outside of the body (1) through the slit (4) formed in the longitudinal direction in the body (1) and the lever (5) ) To move along the slit (4) to move the auxiliary probe pin (3) to the outside of the body, so that the thickness of the thinner to check the narrow circuit contact pin inside the body of the circuit test rod By providing the auxiliary probe pin to be used separately, there is an excellent effect to be able to perform a stable circuit test even if the pin interval of the object to be measured.
机译:本发明涉及一种用于测量仪器的电路测试棒,其具有防止短路的辅助探针,以在与安装在主体内部的探针(2)接触的同时滑出主体(1)。测量仪器电路测试杆(1)已安装辅助探针(3),辅助探针(3)通过狭缝(4)连接到主体(1)外部的杠杆(5)沿纵向方向形成在主体(1)和操纵杆(5)中)沿狭缝(4)移动以将辅助探针(3)移动到主体外部,从而使较薄的厚度检查电路测试棒主体内部的窄电路接触针脚。通过单独使用辅助探针,即使被测物的针脚间隔也能进行稳定的电路测试,效果极佳。 。

著录项

  • 公开/公告号KR100210407B1

    专利类型

  • 公开/公告日1999-07-15

    原文格式PDF

  • 申请/专利权人 DAEWOO TELECOM LTD.;

    申请/专利号KR19970020663

  • 发明设计人 이민형;

    申请日1997-05-26

  • 分类号G01R1/06;

  • 国家 KR

  • 入库时间 2022-08-22 02:15:41

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